Reconstrucción del perfil de índice de refracción de una fibra óptica de silicio puro por el método de los elementos finitos y el patrón de campo cercano

Abstract

The purpose of this work is to show a technique to reconstruct the proflie of the index of refraction (PIR) of optic fiber, based on the comparision of the patterns of intensity of the mode of fundamental propagation base on experimentation, and the one obtained theoretically by means of the method of finite elements, using a merit function to adjust parameters. In order to validate the technique, a pure silicon nucleus fiber whose index of refraction has be en measured by the method of the refracted field near (RFN) is applied.